1 INTRODUCTION AND SPECIFICATIONS TT. INTRODUCTION .. 1-1 1-2. SPECIFICATIONS .. 1-2 1-3. SAFETY CONSIDERATIONS .. 1-4 1-4. LIST OF ACCESSORIES .. 1-4 Section 2 OPERATING INSTRUCTIONS IT. INTRODUCTION .. 2-1 2-2. UNPACKING YOUR INSTRUMENT .. 2-1 2-3. GENERAL OPERATION .. 2-1 2-4. FUSE REPLACEMENT .. 2-2 2-5. PHYSICAL FEATURES .. 2-2 2-6. Front Panel .. 2-2 2-7. Back Panel .. 2-4 2-8. CRT Display .. 2-4 2-9. OPERATION .. 2-5 2-10. INITIAL SETUP .. 2-6 2-11. Range Selection .. 2-6 2-12. Channel Selection .. 2-6 2-13. Frequency Selection .. 2-8 2-14. Pulse Generator .. 2-8 2-15. HUNTRON SWITCHER 410 CONNECTIONS .. 2-10 2-16. TRACKER TRAINING .. 2-11 2-17. EXTERNAL CLEANING AND LUBRICATION .. 2-11 2-18. STORAGE INSTRUCTIONS .. 2-11 Section 3 THEORY OF OPERATION IT INTRODUCTION .. 3-1 3-2. FUNCTIONAL OVERVIEW .. 3-1 3-3. Control Logic .. 3-2 3-4. Oscillator .. 3-3 3-5. Signal Section .. 3-4 3-6. Pulse Generator .. 3-5 3-7. CRT Display .. 3-7 3-8. Power Supply .. 3-7 3-9. VOLTAGE AND POWER CONSIDERATIONS .. 3-7 3-10. Power in a Resistor .. 3-8 3-11. Power in a Diode .. 3-9 3-12. Power in a Zener Diode .. 3-10 4 MAINTENANCE TT. INTRODUCTION .. 4-1 4-2. SERVICE INFORMATION .. 4-1 4-3. CMOS HANDLING PROCEDURES .. 4-1 4-4. DISASSEMBLY PROCEDURE .. 4-2 4-5. REASSEMBLY PROCEDURE .. 4-9 4-6. PERFORMANCE TESTS .. 4-11 4-7. INTERNAL ADJUSTMENTS .. 4-14 4-8. TROUBLESHOOTING .. 4-18 Section 5 LIST OF REPLACEABLE PARTS TT INTRODUCTION .. 5-1 5-2. HOW TO OBTAIN PARTS .. 5-1 Section 6 SCHEMATIC DIAGRAMS ■£T SCHEMATICS .. 6-1 Section 7 RESISTORS, CAPACITORS AND INDUCTORS TT. TESTING RESISTORS .. 7-1 7-2. Low Range .. 7-1 7-3. Medium 1 Range .. 7-1 7-4. Medium 2 Range .. 7-2 7-5. High Range .. 7-3 7-6. TESTING CAPACITORS .. 7-3 7-7. TESTING INDUCTORS .. 7-5 7-8. TESTING FERRITE INDUCTORS .. 7-7 Section 8 TESTING DIODES &T THE SEMICONDUCTOR DIODE AND ITS CHARACTERISTICS .. 8-1 8-2. Diode Symbol and Definition .. 8-1 8-3. The Volt-Ampere Characteristic .. 8-2 8-4. SILICON DIODES .. 8-2 8-5. Signatures of a Good Diode .. 8-2 8-6. Signatures of Defective Diodes .. 8-3 8-7. Signatures of a High Voltage Diode .. 8-7 8-8. RECTIFIER BRIDGES .. 8-8 8-9. LIGHT EMITTING DIODES .. 8-10 8-10. ZENER DIODES .. 8-10 9T BIPOLAR JUNCTION TRANSISTORS .. 9-1 9-2. An Important Note About Testing Transistors .. 9-2 9-3. NPN BIPOLAR TRANSISTORS .. 9-2 9-4. B-E Junction .. 9-3 9-5. C-B Junction .. 9-3 9-6. C-E Connection .. 9-3 9-7. PNP BIPOLAR TRANSISTORS .. 9-5 9-8. B-E Junction .. 9-5 9-9. C-B Junction .. 9-6 9-10. C-E Connection .. 9-7 9-11. POWER TRANSISTORS-NPN AND PNP .. 9-8 9-12. DARLINGTON TRANSISTORS .. 9-8 9-13. Comparing B-E Junctions .. 9-9 9-14. Comparing C-E Connections .. 9-11 9-15. Comparing C-B Junctions .. 9-13 9-16. JUNCTION FIELD EFFECT TRANSISTORS .. 9-13 9-17. Gate-Source Connection .. 9-14 9-18. Drain-Gate Connection .. .. 9-15 9-19. Drain-Source Connection .. 9-16 9-20. MOS FIELD EFFECT TRANSISTORS .. 9-16 9-21. MOSFET WITH PROTECTION DIODE .. 9-17 9-22. Gate-Source Connection .. 9-18 9-23. Drain-Gate Connection .. 9-19 9-24. Drain-Source Connection .. 9-20 9-25. MOSFET WITHOUT A PROTECTION DIODE .. 9-21 Section 10 USING THE PULSE Generator 10-1. INTRODUCTION .. 10-1 10-2. SILICON CONTROLLED RECTIFIERS (SCR) .. .. 10-1 10-3. TRIAC DEVICES .. 10-5 10-4. TRANSISTORS .. 10-7 10-5. OPTOCOUPLERS .. 10-10 10-6. Transistor Optocoupler .. 10-11 10-7. Darlington Transistor Optocoupler .. 10-15 10-8. SCR Optocoupler .. 10-19 10-9. Triac Optocoupler .. 10-23 10-10. Photocell Optocoupler .. 10-26 11 TESTING MULTIPLE COMPONENT CIRCUITS 11-1. 2000 DIAGNOSTIC PRINCIPLES .. 11-1 11-2. DIODE/RESISTOR CIRCUITS .. 11-1 11-3. Diode In Parallel With A Resistor .. 11-1 11-4. Diode In Series With A Resistor .. 11-4 11-5. DIODE AND CAPACITOR PARALLEL COMBINATION .. 11-6 11-6. RESISTOR AND CAPACITOR PARALLEL COMBINATION .. 11-10 11-7. INDUCTOR AND DIODE PARALLEL COMBINATION .. 11-11 Section 12 TESTING INTEGRATED CIRCUITS 12-1. INTRODUCTION .. 12-1 12-2. Integrated Circuit Technology .. 12-1 12-3. Integrated Circuit Testing Techniques .. 12-2 12-4. LINEAR OPERATIONAL AMPLIFIERS .. 12-3 12-5. LINEAR VOLTAGE REGULATORS .. .. 12-8 12-6. The 7805 Regulator .. 12-8 12-7. The 7905 Regulator .. 12-11 12-8. 555 TIMERS .. 12-14 12-9. TTL DIGITAL INTEGRATED CIRCUITS .. 12-20 12-10. General .. 12-20 12-11. TTL Devices With Totem Pole Output .. 12-21 12-12. LS TTL Devices .. 12-24 12-13. Tri-State LS TTL Devices .. 12-25 12-14. CMOS INTEGRATED CIRCUITS .. 12-28 12-15. Quad NAND Gate .. 12-29 12-16. Analog Switch .. 12-30 12-17. MOS STATIC RAM .. 12-33 12-18. EPROM .. 12-36 12-19. BIPOLAR PROM .. 12-40 12-20. DIGITAL TO ANALOG CONVERTER .. 12-43 12-21. MICROPROCESSORS .. 12-47 Section 13 TESTING COMPONENTS BY COMPARISON 13-1. INTRODUCTION .. 13-1 13-2. SETUP PROCEDURES .. 13-1 13-3. POWER TRANSISTORS MJE240 .. 13-2 13-4. MJE240 B-E Junction .. 13-2 13-5. MJE240 C-E Connection .. 13-4 13-6. HIGH VOLTAGE DIODE HV15F .. 13-6 13-7. 100nF 25V ELECTROLYTIC CAPACITOR .. 13-7 14 SOLVING BUS PROBLEMS 14-1. INTRODUCTION .. 14-1 14-2. STUCK WIRED-OR BUS .. 14-1 14-3. UNSTUCK WIRED-OR BUS .. 14-1 14-4. MEMORIES .. 14-1 Section 15 TROUBLESHOOTING TIPS 15-1. TIPS ON USING YOUR 2000 .. 15-1 Appendices Appendix A HUNTRON TRACKER CMOS TEST .. A-l Appendix B HUNTRON TRACKER TTL AND CMOS TESTS .. B-l